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Manufacturing Systems
MFRL-BI: Design of a Model-free Reinforcement Learning Process Control Scheme by Using Bayesian Inference
This paper introduces MFRL-BI, a model-free reinforcement learning process control scheme using Bayesian inference to enhance control accuracy in manufacturing systems.
Yanrong Li
,
Juan Du
,
Wei Jiang
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arXiv
APFC: Adaptive Particle Filter for Change Point Detection of Profile Data in Manufacturing Systems
This paper introduces an adaptive particle filter algorithm (APFC) for efficient change point detection in manufacturing systems, validated through simulations and real-world cases.
Yukun Xie
,
Juan Du
,
Jianguo Wu
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